Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC
- Title
- Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC
- Authors
- Xu, P; Qi, D; Schoelz, JK; Thompson, J; Thibado, PM; Wheeler, VD; Nyakiti, LO; Myers-Ward, RL; Eddy, CR Jr; Gaskill, DK; Neek-Amal, M;Peeters, FM
- Journal
- Carbon
- Year
- 2014
- URL
- http://www.sciencedirect.com/science/article/pii/S0008622314007684
- ISBN/ISSN
- 0008-6223
- DOI
- 10.1016/j.carbon.2014.08.028
