Energy-Dependence of Neutron Damage in Silicon Bipolar-Transistors

by Sparks, M. H.; Flanders, T. M.; Williams, J. G.; Kelly, J. G.; Sallee, W. W.; Roknizadeh, M.; Meason, J. L.

Journal
IEEE Transactions on Nuclear Science
Volume
36
Issue
6
Year
1989
Start Page
1904-1911
URL
https://dx.doi.org/10.1109/23.45385
ISBN/ISSN
1558-1578; 0018-9499
DOI
10.1109/23.45385