Energy-Dependence of Neutron Damage in Silicon Bipolar-Transistors
by Sparks, M. H.; Flanders, T. M.; Williams, J. G.; Kelly, J. G.; Sallee, W. W.; Roknizadeh, M.; Meason, J. L.
- Journal
- IEEE Transactions on Nuclear Science
- Volume
- 36
- Issue
- 6
- Year
- 1989
- Start Page
- 1904-1911
- URL
- https://dx.doi.org/10.1109/23.45385
- ISBN/ISSN
- 1558-1578; 0018-9499
- DOI
- 10.1109/23.45385