Processor-Controlled Microdensitometry

by Ewbank, John David; Bowers, Peter Edward; Pinegar, J. F.; Schäfer, Lothar

Journal
Applied Spectroscopy
Volume
35
Issue
6
Year
1981
Start Page
540
ISBN/ISSN
1943-3530; 0003-7028
DOI
10.1366/0003702814732120