Confocal Raman depth-profile analysis of the electrical and structural properties in III-nitride structures
- Title
- Confocal Raman depth-profile analysis of the electrical and structural properties in III-nitride structures
- Authors
- Strelchuk, V. V.; Bryksa, V. P.; Avramenko, K. A.; Valakh, M. Ya; Belyaev, A. E.; Mazur, Yu I.; Ware, M. E.; Decuir, E. A., Jr.; Salamo, G. J.
- Journal
- Physica Status Solidi C: Current Topics in Solid State Physics, Vol 8, no 7-8
- Volume
- 8
- Issue
- 7-8
- Year
- 2011
- Start Page
-
- ISBN/ISSN
- 1862-6351
- DOI
- 10.1002/pssc.201001077
