Investigation of indium distribution in InGaAs/GaAs quantum dot stacks using high-resolution x-ray diffraction and Raman scattering
- Title
- Investigation of indium distribution in InGaAs/GaAs quantum dot stacks using high-resolution x-ray diffraction and Raman scattering
- Authors
- Mazur, Y.I.; Wang, Z.M.; Salamo, G.J.; Strelchuk, V.V.; Kladko, V.P.; Machulin, V.F.; Valakh, M.Y.; Manasreh, M.O.
- Journal
- Journal of Applied Physics
- Volume
- 99
- Issue
- 2
- Year
- 2006
- Start Page
- 23517
- ISBN/ISSN
- 0021-8979
- DOI
- 10.1063/1.2163009
