Defect recombination induced by density-activated carrier diffusion in nonpolar InGaN quantum wells

Xiao, Min

Title
Defect recombination induced by density-activated carrier diffusion in nonpolar InGaN quantum wells
Authors
Yang, F; Zhang, CF; Shi, CT; Park, MJ; Kwak, JS; Jung, S; Choi, YH; Wu, XW; Wang, XY; Xiao, M
Journal
Applied Physics Letters
Volume
103
Issue
12
Year
2013
Start Page
123506
ISBN/ISSN
0003-6951
DOI
10.1063/1.4821454