Surface plasmon density of states at the metal-dielectric interface: Dependence of metal layer thickness and dielectric material
- Title
- Surface plasmon density of states at the metal-dielectric interface: Dependence of metal layer thickness and dielectric material
- Authors
- Komarala, Vamsi K.; Guo, Wei-Hua; Xiao, Min
- Journal
- Journal of Applied Physics
- Volume
- 107
- Issue
- 1
- Year
- 2010
- Start Page
- 014309
- URL
-
- ISBN/ISSN
- 0021-8979
- DOI
-
